Gerhard Hobler: search on Z-Library

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1

Ion multibeam nanopatterning for photonic applications: Experiments and simulations, including study of precursor gas induced etching and deposition

Ebm, Christoph, Platzgummer, Elmar, Loeschner, Hans, Eder-Kapl, Stefan, Joechl, Peter, Kuemmel, Marco, Reitinger, Ruediger, Hobler, Gerhard, Koeck, Anton, Hainberger, Rainer, Wellenzohn, Markus, Letzk

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2009

Language:

english

File:

PDF, 1.27 MB

english, 2009

2

Topography simulation of sputtering using an algorithm with second order approximation in space

Matthias Budil, Gerhard Hobler

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2011

Language:

english

File:

PDF, 337 KB

english, 2011

3

Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF[sub 2] on SiO[sub 2]

Ebm, Christoph, Hobler, Gerhard, Waid, Simon, Wanzenboeck, Heinz D.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 690 KB

english, 2010

4

Probing the limitations of Sigmund's model of spatially resolved sputtering using Monte Carlo simulations

Hobler, Gerhard, Bradley, R. Mark, Urbassek, Herbert M.

Journal:

Physical Review B

Year:

2016

Language:

english

File:

PDF, 1.52 MB

english, 2016

5

Mission Reliability for URLLC in Wireless Networks

Hobler, Tom, Simsek, Meryem, Fettweis, Gerhard P.

Journal:

IEEE Communications Letters

Year:

2018

Language:

english

File:

PDF, 302 KB

english, 2018

6

Assessment of approximations for efficient topography simulation of ion beam processes: 10 keV Ar on Si

Christoph Ebm, Gerhard Hobler

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2009

Language:

english

File:

PDF, 444 KB

english, 2009

7

Boron implantation in Si: Channeling effects studied by SIMS and simulation

Chunsheng Tian, Stefan Gara, Gerhard Hobler, Gerhard Stingeder

Journal:

Microchimica Acta

Year:

1992

Language:

english

File:

PDF, 477 KB

english, 1992

8

Sputter-redeposition method for the fabrication of automatically sealed micro/nanochannel using FIBs

Heung-Bae Kim, Gerhard Hobler, Andreas Steiger, Alois Lugstein, Emmerich Bertagnolli, Elmar Platzgummer, Hans Loeschner

Journal:

International Journal of Precision Engineering and Manufacturing

Year:

2011

Language:

english

File:

PDF, 713 KB

english, 2011

9

The significance of redeposition and backscattering in nanostructure formation by focused ion beams

Sloan Lindsey, Gerhard Hobler

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2012

Language:

english

File:

PDF, 969 KB

english, 2012

10

Simulation-based approach for the accurate fabrication of blazed grating structures by FIB

Kim, Heung-Bae, Hobler, Gerhard, Steiger, Andreas, Lugstein, Alois, Bertagnolli, Emmerich

Journal:

Year:

2007

Language:

english

File:

PDF, 255 KB

english, 2007

11

Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface

MoberlyChan, Warren J., Adams, David P., Aziz, Michael J., Hobler, Gerhard, Schenkel, Thomas

Journal:

Year:

2007

Language:

english

File:

PDF, 2.53 MB

english, 2007

12

Full three-dimensional simulation of focused ion beam micro/nanofabrication

Kim, Heung-Bae, Hobler, Gerhard, Steiger, Andreas, Lugstein, Alois, Bertagnolli, Emmerich

Journal:

Year:

2007

Language:

english

File:

PDF, 1.31 MB

english, 2007

13

Level set approach for the simulation of focused ion beam processing on the micro/nano scale

Kim, Heung-Bae, Hobler, Gerhard, Steiger, Andreas, Lugstein, Alois, Bertagnolli, Emmerich

Journal:

Year:

2007

Language:

english

File:

PDF, 1.23 MB

english, 2007

14

Simulation of ion beam induced micro/nano fabrication

Kim, Heung-Bae, Hobler, Gerhard, Lugstein, Alois, Bertagnolli, Emmerich

Journal:

Journal of Micromechanics and Microengineering

Year:

2007

Language:

english

File:

PDF, 480 KB

english, 2007

15

Monte Carlo simulations of defect recovery within a 10 keV collision cascade in 3C–SiC

Rong, Zhouwen, Gao, Fei, Weber, William J., Hobler, Gerhard

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 796 KB

english, 2007

16

Quantitative simulation of ion-beam induced deposition of nanostructures

Ebm, Christoph, Hobler, Gerhard, Waid, Simon, Wanzenboeck, Heinz D.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2011

Language:

english

File:

PDF, 851 KB

english, 2011

17

Combined binary collision and continuum mechanics model applied to focused ion beam milling of a silicon membrane

Hobler, Gerhard

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2015

Language:

english

File:

PDF, 1.75 MB

english, 2015

18

Simulation of Focused Ion Beam Induced Damage Formation in Crystalline Silicon

Hobler, Gerhard, Lugstein, Alois, Brezna, Wolfgang, Bertagnolli, Emmerich

Journal:

MRS Proceedings

Year:

2003

Language:

english

File:

PDF, 749 KB

english, 2003

19

Simulation of Ion-beam Induced Etching and Deposition Using a Non-local Recoil-based Algorithm

Ebm, Christoph, Hobler, Gerhard

Journal:

MRS Proceedings

Year:

2009

Language:

english

File:

PDF, 211 KB

english, 2009

20

Coupled Kinetic Monte Carlo and Molecular Dynamics Simulations of Implant Damage Accumulation in Silicon

Otto, Gustav, Hobler, Gerhard

Journal:

MRS Proceedings

Year:

2003

File:

PDF, 318 KB

2003

21

Electronic Stopping of Channeled Ions in Silicon

Hobler, Gerhard, Pötzl, Hans W.

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 358 KB

english, 1992

22

Sputtering of silicon membranes with nanoscale thickness

Hobler, Gerhard, Nietiadi, Maureen L., Bradley, R. Mark, Urbassek, Herbert M.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 1.41 MB

english, 2016

23

nanospheres

Urbassek, Herbert M., Nietiadi, Maureen L., Bradley, R. Mark, Hobler, Gerhard

Journal:

Physical Review B

Year:

2018

Language:

english

File:

PDF, 1.01 MB

english, 2018

24

Crater function moments: Role of implanted noble gas atoms

Hobler, Gerhard, Maciążek, Dawid, Postawa, Zbigniew

Journal:

Physical Review B

Year:

2018

Language:

english

File:

PDF, 1.66 MB

english, 2018

25

[IEEE 2019 IEEE 2nd 5G World Forum (5GWF) - Dresden, Germany (2019.9.30-2019.10.2)] 2019 IEEE 2nd 5G World Forum (5GWF) - On Dependability Metrics for Wireless Industrial Communications - Applied to IEEE 802.11ax

Trabl, Andreas, Scheuvens, Lucas, Hobler, Tom, Franchi, Norman, Fettweis, Gerhard P.

Year:

2019

File:

PDF, 368 KB

2019

26

[IEEE 2019 IEEE 2nd 5G World Forum (5GWF) - Dresden, Germany (2019.9.30-2019.10.2)] 2019 IEEE 2nd 5G World Forum (5GWF) - Wireless Control Communications Co-Design via Application-Adaptive Resource Management

Scheuvens, Lucas, Hobler, Tom, Barreto, Andre Noll, Fettweis, Gerhard P.

Year:

2019

File:

PDF, 444 KB

2019

27

[IEEE 2019 19th International Workshop on Junction Technology (IWJT) - Kyoto, Japan (2019.6.6-2019.6.7)] 2019 19th International Workshop on Junction Technology (IWJT) - Aspects of Highly-channeled MeV Implants of Dopants in Si(100)

Current, Michael, Hobler, Gerhard, Kawasaki, Yoji

Year:

2019

File:

PDF, 10.23 MB

2019

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